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~person:"Su, J C P"
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Su, J C P
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IEEE transactions on reliability : R ; IEEE T R
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Approximate Reliability Function Based on Wavelet Latin Hypercube Sampling and Bee Recurrent Neural Network
Yeh, W-C
;
Su, J C P
;
Hsieh, T-J
;
Chih, M
;
Liu, S-L
- In:
IEEE transactions on reliability : R ; IEEE T R
60
(
2011
)
2
,
pp. 404-415
Persistent link: https://www.econbiz.de/10009167603
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