CATTANI, M.; VAZ, A. R.; WIEDERKEHR, R. S.; TEIXEIRA, F. S. - In: Surface Review and Letters (SRL) 14 (2007) 01, pp. 87-91
We report electrical resistivity measurements of platinum and gold thin films over a range of film thickness d (1.3 ≤ d ≤ 11.7nm), together with associated measurements of the film morphological and crystallographic grain size. The resistivity results are compared to predictions of the...