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The duration of patent examination at the European Patent Office
Harhoff, Dietmar
;
Wagner, Stefan
- In:
Management science : journal of the Institute for …
55
(
2009
)
12
,
pp. 1969-1984
Persistent link: https://www.econbiz.de/10003928498
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A brief history of space and time : the scope-year index as a patent value indicator based on families and renewals
Van Pottelsberghe de la Potterie, Bruno
;
Van Zeebroeck, …
-
2007
Persistent link: https://www.econbiz.de/10003493340
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