Sharma, Vikrant; Sastry, O.S.; Kumar, Arun; Bora, Birinchi - In: Energy 72 (2014) C, pp. 536-546
Understanding degradation mechanism is of utmost importance for long term reliability of photovoltaic technology. In the present study, degradation analysis of three different photovoltaic technology modules namely a-Si (amorphous single junction silicon), HIT (hetro-junction intrinsic thin...