Ye, Zhi-Sheng; Shen, Yan; Xie, Min - In: European Journal of Operational Research 221 (2012) 2, pp. 360-367
As many products are becoming increasingly more reliable, traditional lifetime-based burn-in approaches that try to fail defective units during the test require a long burn-in duration, and thus are not effective. Therefore, we promote the degradation-based burn-in approach that bases the...