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sampling scheme
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asymptotic consistency
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Sriram, T.
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Mukhopadhyay, N.
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Zheng, Shen
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Annals of the Institute of Statistical Mathematics
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Metrika
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Sequential Fixed-Width Confidence Interval for the Product of Two Means
Zheng, Shen
;
Sriram, T.
;
Seila, Andrew
- In:
Annals of the Institute of Statistical Mathematics
50
(
1998
)
1
,
pp. 119-145
Persistent link: https://www.econbiz.de/10005184655
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On sequential comparisons of means of first-order autoregressive models
Mukhopadhyay, N.
;
Sriram, T.
- In:
Metrika
39
(
1992
)
1
,
pp. 155-164
Persistent link: https://www.econbiz.de/10005375838
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