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Search: person:"Chen, F.L."
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Estimation
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Chen, F.L.
6
Huang, H.J.
2
Black, J.T.
1
Chang, C.-K.
1
Chen, F L
1
Chen, F. L.
1
Chen, F.-L.
1
Chen, Mei-yuan
1
Chiang, Y.M.
1
Hsieh, H.-W.
1
Joo, D.
1
Lin, F.-L.
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Liu, S.F.
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Computers & industrial engineering : CAIE ; an internat. journal
3
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers
3
Journal of the Operational Research Society : OR
2
Applied economics letters
1
International journal of industrial engineering : applications and practice
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OLC EcoSci
8
ECONIS (ZBW)
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1
Economic statistical design for x-bar control charts under non-normal distributed data with Weibull in-control time
Chen, F. L.
;
Yeh, Chun-hsien
- In:
Journal of the Operational Research Society : OR
62
(
2011
)
4
,
pp. 750-759
Persistent link: https://www.econbiz.de/10008987961
Saved in:
2
Economic statistical design for x-bar control charts under non-normal distributed data with Weibull in-control time
Chen, F L
;
Yeh, C H
- In:
Journal of the Operational Research Society : OR
62
(
2011
)
4
,
pp. 750-760
Persistent link: https://www.econbiz.de/10008850997
Saved in:
3
Relations between health care expenditure and income : an application of local quantile regressions
Chen, Mei-yuan
;
Lin, F.-L.
;
Chang, C.-K.
- In:
Applied economics letters
16
(
2009
)
1/3
,
pp. 177-181
Persistent link: https://www.econbiz.de/10003822695
Saved in:
4
Variable Sampling Interval Synthetic Control Charts for Jointly Monitoring Process Mean and Standard Deviation
Chen, F.L.
;
Huang, H.J.
- In:
International journal of industrial engineering : …
13
(
2006
)
2
,
pp. 136-146
Persistent link: https://www.econbiz.de/10007269163
Saved in:
5
A synthetic control chart for monitoring process dispersion with sample standard deviation
Huang, H.J.
;
Chen, F.L.
- In:
Computers & industrial engineering : CAIE ; an …
49
(
2005
)
2
,
pp. 221-240
Persistent link: https://www.econbiz.de/10005919854
Saved in:
6
Recognition of defect spatial patterns in semiconductor fabrication
Hsieh, H.-W.
;
Chen, F.-L.
- In:
International journal of production research : American …
42
(
2004
)
19
,
pp. 4153-4172
Persistent link: https://www.econbiz.de/10006125137
Saved in:
7
Wafer bin map recognition using a neural network approach
Liu, S.F.
;
Chen, F.L.
;
Lu, W.B.
- In:
International journal of production research : American …
40
(
2002
)
10
,
pp. 2207-2224
Persistent link: https://www.econbiz.de/10006129473
Saved in:
8
Sculptured surface reconstruction from CMM measurement data by a software iterative approach
Chiang, Y.M.
;
Chen, F.L.
- In:
International journal of production research : American …
37
(
1999
)
8
,
pp. 1679-1696
Persistent link: https://www.econbiz.de/10006135795
Saved in:
9
Curve and surface approximation from CMM measurement data
Meng, C.
;
Chen, F.L.
- In:
Computers & industrial engineering : CAIE ; an …
30
(
1996
)
2
,
pp. 211-226
Persistent link: https://www.econbiz.de/10007315884
Saved in:
10
Machine vision in the automated detection and diagnosis of dimensional errors in end machining
Chen, F.L.
;
Joo, D.
;
Black, J.T.
- In:
Computers & industrial engineering : CAIE ; an …
26
(
1994
)
2
,
pp. 223-236
Persistent link: https://www.econbiz.de/10006000030
Saved in:
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