Chang, C. J.; Fann, C. S. J.; Chou, W. C.; Lian, I. B. - In: Statistics & Probability Letters 63 (2003) 3, pp. 267-274
The distribution of the length of the longest run has wide applications in regard to reliability and DNA sequencing. Statistical tests based on the longest well-matching run are usually considered to be more reasonable than tests based on the perfect-matching run. In this paper, a method adopted...