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  • Search: person:"Dharmasena, L. S."
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Year of publication
Subject
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process yield 2 Business process management 1 Expanding Knowledge in the Information and Computing Sciences 1 Index 1 Index number 1 Industrie 1 Information Systems not elsewhere classified 1 Manufacturing industries 1 Multivariate Analyse 1 Multivariate analysis 1 Nadaraya- Watson estimator 1 Product quality 1 Produktqualität 1 Prozessmanagement 1 Quality management 1 Qualitätsmanagement 1 Statistical distribution 1 Statistical test 1 Statistische Verteilung 1 Statistischer Test 1 Stochastic process 1 Stochastischer Prozess 1 Theorie 1 Theory 1 asymptotic properties 1 confidence intervals 1 fixed-width confidence interval 1 hypothesis tests 1 local linear estimator 1 location-scale family of distributions 1 manufacturing 1 multivariate process capability index 1 nonparametric regression 1 purely sequential procedure 1 random design 1 two-stage sequential procedure 1 univariate and multivariate yield indices 1
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Online availability
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Free 1 Undetermined 1
Type of publication
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Article 3
Type of publication (narrower categories)
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Article in journal 2 Aufsatz in Zeitschrift 2 Congress Report 1
Language
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English 3
Author
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Dharmasena, L. S. 3 Zeephongsekul, Panlop 2 Ao, S. I. 1 Castillo, Oscar 1 Douglas, Craig 1 Feng, David Dagan 1 Lee, Jeong-A. 1 Zeephongsekul, P. 1 de Silva, B. M. 1
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Published in...
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International journal of production research 2
Source
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ECONIS (ZBW) 2 BASE 1
Showing 1 - 3 of 3
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A new process capability index for multiple quality characteristics based on principal components
Dharmasena, L. S.; Zeephongsekul, Panlop - In: International journal of production research 54 (2016) 15/16, pp. 4617-4633
Persistent link: https://www.econbiz.de/10011518916
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Sequential fixed-width confidence bands for kernel regression estimation
Dharmasena, L. S.; de Silva, B. M.; Zeephongsekul, P. - 2008
We consider a random design model based on independent and identically distributed (iid) pairs of observations (Xi, Yi), where the regression function m(x) is given by m(x) = E(Yi|Xi = x) with one independent variable. In a nonparametric setting the aim is to produce a reasonable approximation...
Persistent link: https://www.econbiz.de/10009484047
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Univariate and multivariate process yield indices based on location-scale family of distributions
Dharmasena, L. S.; Zeephongsekul, Panlop - In: International journal of production research 52 (2014) 11, pp. 3348-3365
Persistent link: https://www.econbiz.de/10010357013
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