Soriano, S.; Gourieux, T.; Stunault, A.; Dumesnil, K.; … - In: The European Physical Journal B - Condensed Matter and … 48 (2005) 2, pp. 167-171
In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of...