Mergenthaler, W.; Mauersberg, B.; Feller, J.; Stuehler, L.J. - In: Mathematics and Computers in Simulation (MATCOM) 62 (2003) 3, pp. 443-451
Testing integrated circuits is a costly process. The present article investigates combinatorial optimization problems reducing subsets of tests, which are redundant in a statistical sense. The solution to those problems is brought about by application of the Simulated annealing local search...