Search Results - person:"Ling, M H"

Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress

Balakrishnan, N; Ling, M H - In: IEEE transactions on reliability : R ; IEEE T R 62 (2013) 2, pp. 537-536

Persistent link: https://www.econbiz.de/10010136967

EM algorithm for one-shot device testing under the exponential distribution

Balakrishnan, N.; Ling, M.H. - In: Computational Statistics & Data Analysis 56 (2012) 3, pp. 502-509

The EM algorithm is a powerful technique for determining the maximum likelihood estimates (MLEs) in the presence of binary data since the maximum likelihood estimators of the parameters cannot be expressed in a closed-form. In this paper, we consider one-shot devices that can be used only once...

Persistent link: https://www.econbiz.de/10011056553

Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution

Balakrishnan, N; Ling, M H - In: IEEE transactions on reliability : R ; IEEE T R 61 (2012) 3, pp. 809-822

Persistent link: https://www.econbiz.de/10010021089