Jokiel-Rokita, Alicja; Lazar, Daniel; Magiera, Ryszard - In: Metrika 77 (2014) 8, pp. 1023-1039
A stochastic marked point process model based on doubly stochastic Poisson process is considered in the problem of prediction for the total size of future marks in a given period, given the history of the process. The underlying marked point process <InlineEquation ID="IEq1"> <EquationSource Format="TEX">$$(T_{i},Y_{i})_{i\ge 1}$$</EquationSource> <EquationSource Format="MATHML"> <math xmlns:xlink="http://www.w3.org/1999/xlink"> <msub> <mrow> <mo stretchy="false">(</mo> <msub> <mi>T</mi> <mi>i</mi> </msub> <mo>,</mo> <msub> <mi>Y</mi> <mi>i</mi>...</msub></mrow></msub></math></equationsource></equationsource></inlineequation>