Nameki, Yuta; Bi, Te; Tsunoda, Jun; Niikura, Naoya; … - 2022
C-Si bonds are formed by boron-doped selective growth at the diamond-SiO 2 interface. Two-dimensional hole gas (2DHG) C-Si diamond metal-oxide-semiconductor field-effect transistors (MOSFETs) using C-Si bonded have low interfacial density of states and high hole mobility can be expected. C-Si...