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Search: person:"Pecht, M G"
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Pecht, M G
8
Wu, J
2
Yang, S
2
Haddad, G
1
Hu, C-H
1
Kang, R
1
Lopez, L.D.
1
Ma, E W M
1
Miao, Q
1
Pecht, M.G.
1
Sandborn, P A
1
Si, X-S
1
Sotiris, V A
1
Sun, B
1
Tse, P W
1
Tsui, K-L
1
Wang, W
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Wang, Y
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Wen, Z
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IEEE transactions on reliability : R ; IEEE T R
9
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OLC EcoSci
9
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1
Online Anomaly Detection for Hard Disk Drives Based on Mahalanobis Distance
Wang, Y
;
Miao, Q
;
Ma, E W M
;
Tsui, K-L
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
62
(
2013
)
1
,
pp. 136-145
Persistent link: https://www.econbiz.de/10010093492
Saved in:
2
Benefits and Challenges of System Prognostics
Sun, B
;
Zeng, S
;
Kang, R
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
61
(
2012
)
2
,
pp. 323-336
Persistent link: https://www.econbiz.de/10009985656
Saved in:
3
Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process
Si, X-S
;
Wang, W
;
Hu, C-H
;
Zhou, D-H
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
61
(
2012
)
1
,
pp. 50-68
Persistent link: https://www.econbiz.de/10009844385
Saved in:
4
An Options Approach for Decision Support of Systems With Prognostic Capabilities
Haddad, G
;
Sandborn, P A
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
61
(
2012
)
4
,
pp. 872-883
Persistent link: https://www.econbiz.de/10010056620
Saved in:
5
Electrostatic Monitoring of Gas Path Debris for Aero-engines
Wen, Z
;
Zuo, H
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
60
(
2011
)
1
,
pp. 33-41
Persistent link: https://www.econbiz.de/10008885982
Saved in:
6
Prognostic Health Management - Anomaly Detection Through a Bayesian Support Vector Machine
Sotiris, V A
;
Tse, P W
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
59
(
2010
)
2
,
pp. 277-287
Persistent link: https://www.econbiz.de/10008432117
Saved in:
7
Reliability Demonstration Through Degradation Bogey Testing
Yang, S
;
Wu, J
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
58
(
2009
)
4
,
pp. 604-611
Persistent link: https://www.econbiz.de/10008372281
Saved in:
8
Bayesian Analysis of Pareto Reliability With Dependent Masked Data
Yang, S
;
Wu, J
;
Pecht, M G
- In:
IEEE transactions on reliability : R ; IEEE T R
58
(
2009
)
4
,
pp. 583-589
Persistent link: https://www.econbiz.de/10008340975
Saved in:
9
Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications
Lopez, L.D.
;
Pecht, M.G.
- In:
IEEE transactions on reliability : R ; IEEE T R
58
(
2009
)
2
,
pp. 264-270
Persistent link: https://www.econbiz.de/10008278960
Saved in:
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