Taneichi, Nobuhiro; Sekiya, Yuri; Toyama, Jun - In: Journal of Multivariate Analysis 102 (2011) 9, pp. 1263-1279
In logistic regression models, we consider the deviance statistic (the log likelihood ratio statistic) D as a goodness-of-fit test statistic. In this paper, we show the derivation of an expression of asymptotic expansion for the distribution of D under a null hypothesis. Using the continuous...