Yeh, Hsi-Yin; Huang, Mu-Hsuan; Chen, Dar-Zen - In: Journal of Global Information Management (JGIM) 22 (2014) 4, pp. 54-74
Patent citation can be viewed as an indicator for technical impact and technical invention. Highly cited patents represent the “prior art†of many issued patents and are likely to contain significant technological advances. Enterprises that produced these highly cited patents may...