MOUSSI, A.; BOUHAFS, D.; BENREGUIA, N.; MAHIOU, L.; … - In: Surface Review and Letters (SRL) 15 (2008) 03, pp. 261-264
distributions in the porous layer. After heat treatments, the porous silicon layer is analyzed by secondary ion mass spectroscopy … present deeply in the porous silicon layer as shown by the sputter time. …