Yang, Yulong - In: China journal of accounting research : CJAR 12 (2019) 3, pp. 251-269
capitalizing vs. expensing, this study identifies low-reliability R&D capitalization by the occurrence of ex post impairment of … auditors improve reliability by notably decreasing the likelihood of low-reliability R&D capitalization. The results remain … that analyst coverage does not help differentiate between low-reliability and normal R&D capitalization. Collectively, this …