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institution:"C.E.P.R. Discussion Papers"
~institution:"Economics Department, Organisation de Coopération et de Développement Économiques (OCDE)"
~institution:"Inter-American Development Bank"
~institution:"National Bureau of Economic Research"
~person:"Benner, Mary"
~subject:"Industrieforschung"
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C.E.P.R. Discussion Papers
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Close to You? Bias and Precision in Patent-Based Measures of Technological Proximity
Benner, Mary
-
2007
Patent data have been widely used in research on technological
innovation
to characterize firms' locations as well as … the proximities among firms in
knowledge
space. Researchers could measure proximity among firms with a variety of measures …
Persistent link: https://www.econbiz.de/10012465328
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