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Patent value analysis using deep learning models : the case of IoT technology mining for the manufacturing industry
Trappey, Amy J. C.
;
Trappey, Charles V.
;
Govindarajan, …
- In:
IEEE transactions on engineering management : EM
68
(
2021
)
5
,
pp. 1334-1346
Persistent link: https://www.econbiz.de/10012659372
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