Papandreou, N.; Nedellec, P.; Rosenblatt, J. - In: Physica A: Statistical Mechanics and its Applications 157 (1989) 1, pp. 171-176
Thin Pd films are irradiated with 100 keV Xe ions and their resistance is measured in situ. The rapid increase of the resistance at sufficiently high fluences is attributed to the creation of holes in the sample and confirmed by TEM studies.
