Hoogerheide, Lennart; Dijk, Herman K. van - Tinbergen Instituut - 2008
This discussion paper resulted in a publication in the <I>International Journal of Forecasting</I> (2010). Vol. 26(2), 231-247.<P> An efficient and accurate approach is proposed for forecasting Value at Risk [VaR] and Expected Shortfall [ES] measures in a Bayesian framework. This consists of a new...</p></i>