Olson Lanjouw, Jean; Schankerman, Mark - London School of Economics (LSE) - 2002
technological exhaustion. We first develop an index of patent ‘quality’ using detailed information on patents in the U.S. in seven …We analyse the determinants of the decline in measured research productivity (the patent/R&D ratio) using panel data on … manufacturing firms in the U.S. for the period 1980-93. We focus on three factors: the level of demand, the quality of patents, and …