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~institution:"National Bureau of Economic Research"
~institution:"Zentrum für Europäische Wirtschaftsforschung"
~language:"eng"
~language:"mul"
~person:"Benner, Mary"
~subject:"Industrieforschung"
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Close to You? Bias and Precision in Patent-Based Measures of Technological Proximity
Benner, Mary
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2007
Patent data have been widely used in research on technological
innovation
to characterize firms' locations as well as …
Persistent link: https://www.econbiz.de/10012465328
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