This 2009 edition of the OECD Patent Statistics Manual takes stock of the recent developments in the field. It provides guiding principles for the use of patent data in the context of S&T measurement, and recommendations for the compilation and interpretation of patent indicators in this...

This publication contains the proceedings of the World Forum on Key Indicators held in Palermo in November 2004. In it, statisticians from governmental statistical offices, international organisations, and academia explain why indicator systems are useful and how statistics can be used, how to...