Diks, Cees; Panchenko, Valentyn - Tinbergen Instituut - 2005
See also C. Diks: <A href="http://www1.fee.uva.nl/cendef/upload/6/ecss_diks_r1.pdf">'Nonparametric tests for independence'</A>. In R. Meyers (Ed.), Encyclopedia of Complexity and Systems Science. Berlin: Springer Verlag, 2009. <P> Tests for serial independence and goodness-of-fit based on divergence notions between probability distributions, such as the...</p></a>