Mcwilliams, Bruce; Tsur, Yacov; Hochman, Eithan; … - In: Applied Economics Letters 5 (1998) 6, pp. 369-373
This paper presents a framework for interpreting and using the count-data model for estimating the time of technology adoption. The Bernoulli trials of the negative binomial model are interpreted as the stages involved in a potential adopter learning and updating information relevant to a new...