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~isPartOf:"Applied economics letters"
~person:"Allen, David E."
~person:"Kim, Young Shin"
~person:"Scaillet, Olivier"
~subject:"Risikomaß"
~subject:"Statistische Verteilung"
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Beyond reasonable doubt : multiple tail risk measures applied to European industries
Allen, David E.
;
Powell, Robert John
;
Singh, Abhay Kumar
- In:
Applied economics letters
19
(
2012
)
7/9
,
pp. 671-676
Persistent link: https://www.econbiz.de/10009631004
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