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Can survey item characteristics relevant to mode-specific measurement error be coded reliably?
Bais, Frank
;
Schouten, Barry
;
Lugtig, Peter
;
Toepoel, Vera
-
2015
Persistent link: https://www.econbiz.de/10011407966
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Estimating survey questionnaire profiles for measurement error risk
Schouten, Barry
;
Bais, Frank
;
Toepoel, Vera
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2016
Persistent link: https://www.econbiz.de/10011574969
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