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Econometric models of event counts
ULB Institutional Repository
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Patents, R&D, and technological spillovers at the firm level : some evidence from econometric count models for panel data
Cincera, Michele
- In:
Journal of applied econometrics
12
(
1997
)
3
,
pp. 265-280
Persistent link: https://www.econbiz.de/10001336080
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