Moon, Hyungsik Roger; Perron, Benoit; Phillips, Peter C. B. - In: Econometrics Journal 17 (2014) 3, pp. 338-372
Generalizations of the point‐optimal panel unit root tests of Moon, Perron and Phillips (MPP) are developed to cover cases of serially correlated errors. The resulting statistics involve two modifications relative to those of MPP: (a) the error variance is replaced by the long‐run variance;...