Giulietti, Monica; Otero, Jesús; Smith, Jeremy - In: Economics Letters 101 (2008) 3, pp. 188-192
The cross-sectionally augmented IPS (CIPS) test of Pesaran (2007) is extended for a three-dimensional (3D) panel. This 3D-CIPS test is correctly sized. However, a bootstrapped IPS test has better power performance than the 3D-CIPS, except for high levels of cross-sectional dependency.