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How to measure patent thickets : a novel approach
Graevenitz, Georg von; Wagner, Stefan; Harhoff, Dietmar - In: Economics letters 111 (2011) 1, pp. 6-9
Persistent link: https://www.econbiz.de/10009241385
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Truncated means and variances
Burdett, Kenneth - In: Economics letters 52 (1996) 3, pp. 263-267
Persistent link: https://www.econbiz.de/10001212507
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Wild bootstrapping variance ratio tests
Kim, Jae H. - In: Economics letters 92 (2006) 1, pp. 38-43
Persistent link: https://www.econbiz.de/10003336500
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Estimating labour market transitions and continuations using repeated cross sectional data
Brochu, Pierre - In: Economics letters 111 (2011) 1, pp. 84-87
Persistent link: https://www.econbiz.de/10009241333
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Small-sample inference with spatial HAC estimators
Dorn, Sabrina; Egger, Peter - In: Economics letters 125 (2014) 2, pp. 236-239
Persistent link: https://www.econbiz.de/10010505357
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A nonparametric approach to solving a simple one-sector stochastic growth model
Shaw, Philip - In: Economics letters 125 (2014) 3, pp. 447-450
Persistent link: https://www.econbiz.de/10010506516
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On the use of robust regression in econometrics
Baldauf, Markus; Silva, João Santos - In: Economics letters 114 (2012) 1, pp. 124-127
Persistent link: https://www.econbiz.de/10009517264
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Comparative statics of degenerate critical points
MacCabe, Peter J. - In: Economics letters 21 (1986) 2, pp. 177-181
Persistent link: https://www.econbiz.de/10001016543
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Zero-diagonality as a linear structure
Magnus, Jan R.; Sentana, Enrique - In: Economics letters 196 (2020), pp. 1-4
Persistent link: https://www.econbiz.de/10012510901
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Nonlinear impact estimation in spatial autoregressive models
Ay, Jean-Sauveur; Ayouba, Kassoum; Le Gallo, Julie - In: Economics letters 163 (2018), pp. 59-64
Persistent link: https://www.econbiz.de/10011982927