Avci, M. - In: Mathematics and Computers in Simulation (MATCOM) 79 (2008) 4, pp. 1126-1136
In this work, a neural network-based solution to BSIM3v3 MOSFET model is developed to find the most suitable channel parameters to improve the production yield and operation accuracy of submicron integrated circuits. By means of the proposed solution the channel parameters of each transistor can...