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Degradation - Degradation Analysis of Nano-Contamination in Plasma Display Panels
Bae, S.J.; Kim, S.-J.; Kim, M.S.; Lee, B.J.; Kang, C.W. - In: IEEE transactions on reliability : R ; IEEE T R 57 (2008) 2, pp. 222-229
Persistent link: https://www.econbiz.de/10008065628
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SPECIAL SECTION PAPERS - Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices
Bae, S.J.; Kim, S.-J.; Kuo, W.; Kvam, P.H. - In: IEEE transactions on reliability : R ; IEEE T R 56 (2007) 3, pp. 392-400
Persistent link: https://www.econbiz.de/10007796575