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DISTRIBUTIONS -- PROBABILITY AND STATISTICAL-INFERENCE - Mean residual life of lifetime distributions
Tang, L.; Lu, Y.; Chew, E. - In: IEEE transactions on reliability : R ; IEEE T R 48 (1999) 1, pp. 73-78
Persistent link: https://www.econbiz.de/10006627098
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STATISTICAL INFERENCE - Planning step-stress life-test with a target acceleration-factor
Yeo, K.; Tang, L. - In: IEEE transactions on reliability : R ; IEEE T R 48 (1999) 1, pp. 61-67
Persistent link: https://www.econbiz.de/10006627100
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Analysis of step-stress accelerated-life-test data: A new approach
Tang, L.; Sun, Y.; Goh, T.; Ong, H. - In: IEEE transactions on reliability : R ; IEEE T R 45 (1996) 1, pp. 69-74
Persistent link: https://www.econbiz.de/10006631920
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Reliability prediction using nondestructive accelerated-degradation data: Case study on
Tang, L.; Chang, D. - In: IEEE transactions on reliability : R ; IEEE T R 44 (1995) 4, pp. 562-566
Persistent link: https://www.econbiz.de/10006633752
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Reliability bounds and critical time for the Birnbaum-Saunders distribution
Chang, D.; Tang, L. - In: IEEE transactions on reliability : R ; IEEE T R 42 (1993) 3, pp. 464-469
Persistent link: https://www.econbiz.de/10006639177