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Software Reliability Growth with Test Coverage
Malaiya, Y.K.; Li, N.; Bieman, J.M.; Karcich, R. - In: IEEE transactions on reliability : R ; IEEE T R 51 (2002) 4, pp. 420-426
Persistent link: https://www.econbiz.de/10006615344
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Maintenance and Degradation Modeling - Repairable Consecutive-k-Out-of-n: G Systems With r Repairmen
Wu, Y.; Guan, J. - In: IEEE transactions on reliability : R ; IEEE T R 54 (2005) 2, pp. 328-337
Persistent link: https://www.econbiz.de/10006606824
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Estimation & Testing in an Imperfect-Inspection Model
Srivastava, M.S.; Wu, Y. - In: IEEE transactions on reliability : R ; IEEE T R 42 (1993) 2, pp. 280-286
Persistent link: https://www.econbiz.de/10006639218
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Reliability evaluation for distributed computing networks with imperfect nodes
Wang, S.; Ke, W. - In: IEEE transactions on reliability : R ; IEEE T R 46 (1997) 3, pp. 342-348
Persistent link: https://www.econbiz.de/10006629879
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Transformations of star-delta and delta-star reliability-networks
Sun, C.; Wang, S. - In: IEEE transactions on reliability : R ; IEEE T R 45 (1996) 1, pp. 120-126
Persistent link: https://www.econbiz.de/10006631910