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Reliable Heterogeneous Applications
Lee, J.; Chapin, S.J.; Taylor, S. - In: IEEE transactions on reliability : R ; IEEE T R 52 (2003) 3, pp. 330-339
Persistent link: https://www.econbiz.de/10006611691
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Bayes inference for s-shaped software-reliability growth models
Kuo, L.; Lee, J.; Choi, K.; Yang, T. - In: IEEE transactions on reliability : R ; IEEE T R 46 (1997) 1, pp. 76-80
Persistent link: https://www.econbiz.de/10006631070
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Hierarchiral placement for power hybrid circuits under reliability & wireability constraints
Lee, J.; Chou, J. - In: IEEE transactions on reliability : R ; IEEE T R 45 (1996) 2, pp. 200-207
Persistent link: https://www.econbiz.de/10006633636