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~isPartOf:"International business review : the official journal of the European International Business Academy"
~isPartOf:"International journal of technology management : IJTM"
~isPartOf:"NBER Working Paper"
~person:"Benner, Mary"
~subject:"Wissenstransfer"
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International business review : the official journal of the European International Business Academy
International journal of technology management : IJTM
NBER Working Paper
NBER working paper series
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Research policy : policy, management and economic studies of science, technology and innovation
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Close to You? Bias and Precision in Patent-Based Measures of Technological Proximity
Benner, Mary
-
2015
Patent data have been widely used in research on technological
innovation
to characterize firms' locations as well as …
Persistent link: https://www.econbiz.de/10012750343
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