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A Practical Implementation of the Incapability Index Cpp
Pearn, W.L.; Chen, K.L.; Chen, K.S. - In: International journal of industrial engineering : … 9 (2002) 4, pp. 372-383
Persistent link: https://www.econbiz.de/10005937929
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Measuring Production Performance of Different Product Mixes in Semiconductor Fabrication
Chung, S.-H.; Pearn, W.L.; Lee, A.H.I. - In: International journal of industrial engineering : … 13 (2006) 1, pp. 5-17
Persistent link: https://www.econbiz.de/10007268017
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The Integrated Circuit Packaging Scheduling Problem (ICPSP): A Case Study
Pearn, W.L.; Chung, S.H.; Yang, M.H.; Chen, C.Y. - In: International journal of industrial engineering : … 12 (2005) 3, pp. 296-307
Persistent link: https://www.econbiz.de/10005919703
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Assessing Process Performance Based on the Process Incapability Index Cpp
Lin, P.C.; Pearn, W.L. - In: International journal of industrial engineering : … 12 (2005) 2, pp. 145-158
Persistent link: https://www.econbiz.de/10005921315
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On the Distributional Properties of the Estimated Process Accuracy Index Ca
Lin, G.H.; Pearn, W.L. - In: International journal of industrial engineering : … 11 (2004) 2, pp. 169-177
Persistent link: https://www.econbiz.de/10005925976