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~isPartOf:"International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers"
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International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers
International journal of production research
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Computers & operations research : and their applications to problems of world concern ; an international journal
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A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence
Chien, Chen-Fu
;
Hsu, Shao-Chung
;
Chen, Ying-Jen
- In:
International journal of production research : American …
51
(
2013
)
8
,
pp. 2324-2338
Persistent link: https://www.econbiz.de/10010086207
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