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Patents, R&D, and technological spillovers at the firm level : some evidence from econometric count models for panel data
Cincera, Michele - In: Journal of applied econometrics 12 (1997) 3, pp. 265-280
Persistent link: https://www.econbiz.de/10001336080
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Evidence on agglomeration economies, diseconomies, and growth
Wheeler, Christopher H. - In: Journal of applied econometrics 18 (2003) 1, pp. 79-104
Persistent link: https://www.econbiz.de/10001738249
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Geographic poverty traps? : a micro model of consumption growth in rural China
Jalan, Jyotsna; Ravallion, Martin - In: Journal of applied econometrics 17 (2002) 4, pp. 329-346
Persistent link: https://www.econbiz.de/10001690453
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R&D, innovation and knowledge spillovers : a reapraisal of Botazzi and Peri (2007) in the presence of cross-sectional dependence
Bottasso, Anna; Castagnetti, Carolina; Conti, Maurizio - In: Journal of applied econometrics 30 (2015) 2, pp. 350-352
Persistent link: https://www.econbiz.de/10011332977
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Panel probit with flexible correlated effects : quantifying technology spillovers in the presence of latent heterogeneity
Burda, Martin; Harding, Matthew C. - In: Journal of applied econometrics 28 (2013) 6, pp. 956-981
Persistent link: https://www.econbiz.de/10010351089
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Exploring all VAR orderings for calculating spillovers? : Yes, we can! : a note on Diebold and Yilmaz (2009)
Klößner, Stefan; Wagner, Sven - In: Journal of applied econometrics 29 (2014) 1, pp. 172-179
Persistent link: https://www.econbiz.de/10010414220
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Crack spead hedging : accounting for time-varying volatility spillovers in the energy futures markets
Haigh, Michael S.; Holt, Matthew T. - In: Journal of applied econometrics 17 (2002) 3, pp. 269-289
Persistent link: https://www.econbiz.de/10001676815
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Identifying exchange rate effects and spillovers of US monetary policy shocks in the presence of time-varying instrument relevance
Liao, Wenting; Ma, Jun; Zhang, Chengsi - In: Journal of applied econometrics 38 (2023) 7, pp. 989-1006
Persistent link: https://www.econbiz.de/10014474382
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Rotterdam model versus almost ideal demand system : will the best specification please stand up?
Barnett, William A.; Seck, Ousmane - In: Journal of applied econometrics 23 (2008) 6, pp. 795-824
Persistent link: https://www.econbiz.de/10003766793
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Are risk-averse agents more optimistic? : a Bayesian estimation approach
Ben Mansour, Selima; Jouini, Elyès; Marin, Jean-Michel; … - In: Journal of applied econometrics 23 (2008) 6, pp. 843-860
Persistent link: https://www.econbiz.de/10003766812