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~isPartOf:"Journal of applied econometrics"
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Journal of applied econometrics
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More powerpul panel data unit root tests with an application to mean reversion in real exchange rates
Smith, L. Vanessa
;
Leybourne, Stephen James
;
Kim, Tae-hwan
- In:
Journal of applied econometrics
19
(
2004
)
2
,
pp. 147-170
Persistent link: https://www.econbiz.de/10002010349
Saved in:
2
More powerful panel data unit root tests with an application to mean reversion in real exchange rates
Smith, L.Vanessa
;
Leybourne, Stephen
;
Kim, Tae-Hwan
; …
- In:
Journal of applied econometrics
19
(
2004
)
2
,
pp. 147-170
Persistent link: https://www.econbiz.de/10006964453
Saved in:
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