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Marginal comparisons with the best and the efficiency measurement problem
Kim, Yangseon; Schmidt, Peter - In: Journal of business & economic statistics : JBES ; a … 26 (2008) 2, pp. 253-260
Persistent link: https://www.econbiz.de/10003675739
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Production frontiers and panel data
Schmidt, Peter; Sickles, Robin C. - In: Journal of business & economic statistics : JBES ; a … 2 (1984) 4, pp. 367-374
Persistent link: https://www.econbiz.de/10002781027
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Tests of short memory with thick-tailed errors
Amsler, Christine Elaine; Schmidt, Peter - In: Journal of business & economic statistics : JBES ; a … 30 (2012) 3, pp. 381-390
Persistent link: https://www.econbiz.de/10009657268
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Marginal Comparisons With the Best and the Efficiency Measurement Problem
Kim, Yangseon; Schmidt, Peter - In: Journal of business & economic statistics : JBES ; a … 26 (2008) 2, pp. 253
Persistent link: https://www.econbiz.de/10008221199
Cover Image
Tests of Short Memory With Thick-Tailed Errors
Amsler, Christine; Schmidt, Peter - In: Journal of business & economic statistics : JBES ; a … 30 (2012) 3, pp. 381-391
Persistent link: https://www.econbiz.de/10009995980