Narrow search
Showing 1 - 10 of 2,054
Cover Image
The effects of dynamic feedbacks on LS and MM estimator accuracy in panel data models
Bun, Maurice J. G.; Kiviet, J. F. - In: Journal of econometrics 132 (2006) 2, pp. 409-444
Persistent link: https://www.econbiz.de/10003348774
Cover Image
The effects of dynamic feedbacks on LS and MM estimator accuracy in panel data models : some additional results
Hayakawa, Kazuhiko - In: Journal of econometrics 159 (2010) 1, pp. 202-208
Persistent link: https://www.econbiz.de/10008839928
Cover Image
One instrument to rule them all : the bias and coverage of just-ID IV
Angrist, Joshua D.; Kolesár, Michal - In: Journal of econometrics 240 (2024) 2, pp. 1-18
Persistent link: https://www.econbiz.de/10015075117
Cover Image
On implied volatility for options : some reasons to smile and more to correct
Chen, Song Xi; Xu, Zheng - In: Journal of econometrics 179 (2014) 1, pp. 1-15
Persistent link: https://www.econbiz.de/10010258291
Cover Image
Nonlinear factor models for network and panel data
Chen, Mingli; Fernández-Val, Iván; Weidner, Martin - In: Journal of econometrics 220 (2021) 2, pp. 296-324
Persistent link: https://www.econbiz.de/10012618515
Cover Image
Robust uniform inference for quantile treatment effects in regression discontinuity designs
Chiang, Harold D.; Hsu, Yu-Chin; Sasaki, Yuya - In: Journal of econometrics 211 (2019) 2, pp. 589-618
Persistent link: https://www.econbiz.de/10012303853
Cover Image
Efficient inference on fractionally integrated panel data models with fixed effects
Robinson, Peter M.; Velasco, Carlos - In: Journal of econometrics 185 (2015) 2, pp. 435-452
Persistent link: https://www.econbiz.de/10011348967
Cover Image
Asymptotic theory for differentiated products demand models with many markets
Freyberger, Joachim - In: Journal of econometrics 185 (2015) 1, pp. 162-181
Persistent link: https://www.econbiz.de/10011339878
Cover Image
Second-order corrected likelihood for nonlinear panel models with fixed effects
Dhaene, Geert; Sun, Yutao - In: Journal of econometrics 220 (2021) 2, pp. 227-252
Persistent link: https://www.econbiz.de/10012618510
Cover Image
Dependent microstructure noise and integrated volatility estimation from high-frequency data
Li, Z. Merrick; Laeven, Roger J. A.; Vellekoop, Michel H. - In: Journal of econometrics 215 (2020) 2, pp. 536-558
Persistent link: https://www.econbiz.de/10012439499