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Frontier estimation in nonparametric location-scale models
Florens, Jean-Pierre; Simar, Léopold; Van Keilegom, Ingrid - In: Journal of econometrics 178 (2014) 1, pp. 456-470
Persistent link: https://www.econbiz.de/10010256188
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Estimation and inference in two-stage, semi-parametric models of production processes
Simar, Léopold; Wilson, Paul W. - In: Journal of econometrics 136 (2007) 1, pp. 31-64
Persistent link: https://www.econbiz.de/10003401641
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Unobserved heterogeneity and endogeneity in nonparametric frontier estimation
Simar, Léopold; Vanhems, Anne; Van Keilegom, Ingrid - In: Journal of econometrics 190 (2016) 2, pp. 360-373
Persistent link: https://www.econbiz.de/10011592278
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Bayesian Artificial Neural Networks for frontier efficiency analysis
Tsionas, Efthymios G.; Parmeter, Christopher F.; … - In: Journal of econometrics 236 (2023) 2, pp. 1-14
Persistent link: https://www.econbiz.de/10014365509
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On the bootstrap for Moran’s I test for spatial dependence
Jin, Fei; Lee, Lung-fei - In: Journal of econometrics 184 (2015) 2, pp. 295-314
Persistent link: https://www.econbiz.de/10011339326
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LM tests of spatial dependence based on bootstrap critical values
Yang, Zhenlin - In: Journal of econometrics 185 (2015) 1, pp. 33-59
Persistent link: https://www.econbiz.de/10011339908
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Bootstrap inference for linear dynamic panel data models with individual fixed effects
Gonçalves, Sílvia; Melou, Maximilien Kaffo - In: Journal of econometrics 186 (2015) 2, pp. 407-426
Persistent link: https://www.econbiz.de/10011349453
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A general method for third-order bias and variance corrections on a nonlinear estimator
Yang, Zhenlin - In: Journal of econometrics 186 (2015) 1, pp. 178-200
Persistent link: https://www.econbiz.de/10011349513
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A fast resample method for parametric and semiparametric models
Armstrong, Timothy B.; Bertanha, Marinho; Hong, Han - In: Journal of econometrics 179 (2014) 2, pp. 128-133
Persistent link: https://www.econbiz.de/10010372656
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A consistent nonparametric test of parametric regression functional form in fixed effects panel data models
Lin, Zhongjian; Li, Qi; Sun, Yiguo - In: Journal of econometrics 178 (2014) 1, pp. 167-179
Persistent link: https://www.econbiz.de/10010255448