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Designing a yield-based skip-lot sampling plan for lot acceptance determination
Wu, Chien-wei; Chen, Jr-Tzung; Liu, Shih-Wen - In: Journal of the Operational Research Society 73 (2022) 3, pp. 653-663
Persistent link: https://www.econbiz.de/10013170170
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A modified sampling plan by variables with an adjustable mechanism for lot sentencing
Wu, Chien-wei; Chen, Jr-Tzung - In: Journal of the Operational Research Society 72 (2021) 3, pp. 678-687
Persistent link: https://www.econbiz.de/10012500980
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Comparisons of frequentist and Bayesian inferences for interval estimation on process yield
Wu, Chien-wei; Shu, Ming-Hung; Huang, Ting-Ying; Hsu, Bi-Min - In: Journal of the Operational Research Society 73 (2022) 12, pp. 2694-2705
Persistent link: https://www.econbiz.de/10013533319