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Variables sampling plans with PPM fraction of defectives and process loss consideration
Pearn, W.L.; Wu, Chien-Wei - In: Journal of the Operational Research Society : OR 57 (2006) 4, pp. 450-459
Persistent link: https://www.econbiz.de/10006010447
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Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
Pearn, W.L.; Chung, S.H.; Yang, M.H.; Chen, Y.H. - In: Journal of the Operational Research Society : OR 55 (2004) 11, pp. 1194-1207
Persistent link: https://www.econbiz.de/10006020428
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Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time
Chung, S.H.; Pearn, W.L.; Tai, Y.T. - In: Journal of the Operational Research Society : OR 60 (2009) 7, pp. 921-933
Persistent link: https://www.econbiz.de/10008261992
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Tool replacement policy for one-sided processes with low fraction defective
Pearn, W.L.; Hsu, Y.-C.; Horng Shiau, J.-J. - In: Journal of the Operational Research Society : OR 58 (2007) 8, pp. 1075-1083
Persistent link: https://www.econbiz.de/10007749605
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Solution strategies for multi-stage wafer probing scheduling problem with reentry
Pearn, W.L.; Chung, S.H.; Yang, M.H.; Shiao, K.P. - In: Journal of the Operational Research Society : OR 59 (2008) 5, pp. 637-651
Persistent link: https://www.econbiz.de/10007993337