Pearn, W. L.; Lin, P. C.; Chen, K. S. - In: Metrika 60 (2004) 2, pp. 119-136
The process capability index C<Subscript>pk</Subscript> has been widely used in the manufacturing industry to provide numerical measures on process performance. Since C<Subscript>pk</Subscript> is a yield-based index which is independent of the target T, it fails to account for process centering with symmetric tolerances, and presents an...</subscript></subscript>